Welcome to OGeek Q&A Community for programmer and developer-Open, Learning and Share
Welcome To Ask or Share your Answers For Others

Categories

0 votes
434 views
in Technique[技术] by (71.8m points)

c - Testing Code for Embedded Application

Background:

I am developing a largish project using at Atmel AVR atmega2560. This project contains a lot of hardware based functions (7 SPI devices, 2 I2C, 2 RS485 MODBUS ports, lots of Analogue and Digital I/O). I have developed "drivers" for all of these devices which provide the main application loop with an interface to access the required data.

Question:

The project I am developing will eventually have to meet SIL standards.

I would like to be able to test the code and provide a good level of code coverage. However I am unable to find any information to get me started on how such a testing framework should be set up.

The idea is that I can have a suite of automated tests which will allow future bug fixes and feature additions to be tested to see if they break the code. The thing is I don't understand how the code can be tested on chip.

Do I require hardware to monitor the I/O on the device and emulate externally connected devices? Any pointers that could be provided would be highly appreciated.

--Steve

See Question&Answers more detail:os

与恶龙缠斗过久,自身亦成为恶龙;凝视深渊过久,深渊将回以凝视…
Welcome To Ask or Share your Answers For Others

1 Reply

0 votes
by (71.8m points)

This is a very good question - a common concern for embedded developers. Unfortunately, most embedded developers aren't as concerned as you are and only test the code on real hardware. But as another answer pointed out, this can basically test just the nominal functionality of the code and not the corner/error cases.

There is no single and simple solution to this problem. Some guidelines and techniques exist, however, to do a relatively good job.

First, separate your code into layers. One layer should be "hardware agnostic" - i.e. function calls. Do not ask the user to write into HW registers directly. The other (lower) layer deals with the HW. This layer can be "mocked" in order to test the higher level. The lower level can not be really tested without the HW, but it's not going to change often and needs deep HW integration, so it's not an issue.

A "test harness" will be all your high-level HW agnostic code with a "fake" lower level specifically for testing. This can simulate the HW devices for correct and incorrect functionality and thus allow you to run automated tests on the PC.


与恶龙缠斗过久,自身亦成为恶龙;凝视深渊过久,深渊将回以凝视…
OGeek|极客中国-欢迎来到极客的世界,一个免费开放的程序员编程交流平台!开放,进步,分享!让技术改变生活,让极客改变未来! Welcome to OGeek Q&A Community for programmer and developer-Open, Learning and Share
Click Here to Ask a Question

1.4m articles

1.4m replys

5 comments

57.0k users

...